View TLP55407_4111868.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

TLP554
TOSHIBA PHOTOCOUPLER GaAlAs IRED & PHOTO-IC
TLP554
ISOLATED LINE RECEIVER SIMPLEX/MULTIPLEX DATA TRANSMISSION COMPUTER-PERIPHERAL INTERFACE MICROPROCESSOR SYSTEM INTERFACES DIGITAL ISOLATION FOR A/D,D/A CONVERSION
The TOSHIBA TLP554 a photocoupler which combines a GaAlAsIRED as the emitter and an integrated high gain, high speed photodetector. The output of the detector circuit is an open collector, Schottky Clamped transistor. A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. This provides an effective common mode transient immunity of 1000V/us. Input Current Threshold Switching Speed Common mode transient immunity Guaranteed Performance Over Temperature Isolation Voltage UL Recognized : IF=5mA(Max.) : 10MBd(TYP,@NRZ) : 1000V/us(Min) : 0~70C : 2500Vrms(Min) :UL1577,File No.E67349 Unit: mm
Truth Table (Positive Logic)
INPUT H L H L ENABLE H H L L OUTPUT L H H H
JEDEC TOSHIBA Weight: 0.54 g
11-10C4
SCHEMATIC IF 2 VF 3 ICC IO 8 6 SHIELD IE 5 VCC VO
PIN CONFIGURATION (TOP VIEW) 1:NC 1 8 VCC 2 3 7 6 SHIELD GND 5
GND
4
7 VE
2:ANODE 3:CATHODE 4:N.C. 5:GND 6:VO(OUTPUT) 7:VE(ENABLE) 8:VCC
A 0.1F bypass capacitor must be connected Between pins 8 and 5.(See Note 1)
1
2007-10-01
TLP554
Recommended Operating Conditions
CHARACTERISTIC Low Level input Voltage High Level input current Supply Voltage High-Level Enable Voltage Low-Level Enable Voltage Fan Out(TTL Load) Operating Temperature SYMBOL
VFL IFH
MIN. -3 6.3* 4.5 2.0 0
TYP.
MAX. 1.0 20 5.5 VCC 0.8 8 70
UNIT V mA V V V C
0 5
VCC VEH VEL N Topr
0
Note:
Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document.
*6.3mA condition permits at least 20% CTR degradation Initial switching threshold is 5.0mA or less.
Absolute Maximum Ratings (Ta = 25C)
CHARACTERISTIC Forward Current Reverse Voltage Output Current DETECTOR Output Voltage Supply Voltage Enable Voltage Output Power Dissipation Storage Temperature Range Operating Temperature Range Lead Soldering Temperature (10 s) Isolation Voltage (AC, 1 minute, R.H. 60%) (Note 4) (Note 5) (Note 2) (Note 3) SYMBOL IF VR IO VO VCC VE PO Tstg Topr Tsol BVS RATING 20 5 25 -0.5~7 7 5.5 40 -55~125 -40~85 260 2500 UNIT mA V mA V V V mW C C C Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) The VCC supply voltage to each TLP554 isolator must be bypassed by a 0.1F capacitor or larger.This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. 1 Minute Maximum. Not to exceed VCC by more than 500mV. 2mm below seating plane. Device considered a two-terminal device :Pins 1,2,3 and 4 shorted together,and Pins 5, 6,7 and 8 shorted together.
(Note 2) (Note 3) (Note 4) (Note 5)
LED
2
2007-10-01
TLP554
Electrical Characteristics (Ta = 0~70C , VCC=4.5~5.5V , VFL1.0V)
CHARACTERISTIC Forward Voltage Temperature Coefficient of Forward Voltage Input Reverse Current Input Capacitance SYMBOL VF VF/Ta IR CT TEST CONDITION IF = 10 mA , Ta=25C IF = 10 mA , VR=5V, Ta=25C V = 0 , f = 1MHz , Ta=25C VF = 1.0V VO = 5.5V VE = 2.0V Ta=0~70C Ta=25C MIN. TYP.* 1.65 -2.0 45 10 0.5 MAX. 1.80 10 250 A 10 UNIT V mV/C A pF

High-Level Output Current
IOH
Low-Level Output Voltage High Level input current High Level Supply Current Low Level High Level Enable Current Low Level High Level Enable Voltage Low Level Capacitance (Input-Output) Resistance (Input-Output) (*)All typ.values are at Ta=25C
VOL IFH ICCH ICCL IEH IEL VEH VEL CS RS
IF=5mA , VE=2.0V , IOL=13mA IOL=13mA , VE=2.0V , VOL=0.6V IF=0mA IF=10mA VE=2.0V VCC=5.5V VE=0.5V
0.4
7
0.6
5 15
V mA
VCC=5.5V VE=0.5V
mA
12 -1.0 -1.6 0.6
10
19 -2.0 0.8
pF V mA
(Note 6) 2.0
5x10

VS=0 , f=1MHz , Ta=25
VS=500V , Ta=25 , R.H. 60%
10
14
(Note 6) No pull up resistor required as the device has an internal pull up resistor.
3
2007-10-01
TLP554
Switching Characteristics (Ta = 25C , VCC=5V)
CHARACTERISTIC Propagation Delay Time Output Rise Time(10-90%) Output Fall Time(10-90%) Enable Propagation Delay Time Common Mode Transient Immunity at Hight Level Outout Common Mode Transient Immunity at Low Level Outout LH HL SYMBOL tpLH tpHL tr tf tELH tEHL CMH TEST CIRCUIT TEST CONDITION RL=350 IF=7.50mA IF=07.5mA MIN. TYP. 60 60 30 30 25 25 10000 MAX. 120 120 UNIT ns

1000
1
CL=15pF
IF=7.50 / 07.5mA RL=350, CL=15pF

ns
2
RL=350 CL=15pF IF=7.5 mA VCM=400V
VE=0.53.0V VE=3.00.5V IF=0mA VO(Min)=2.0V
ns
3
CML
RL=350 IF=7.5mA (Note 7) VO(Max)=0.8V -1000 -10000
V/s
(Note 7) CMHThe maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state(i.e.,VOUT>2.0V) CMLThe maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state(i.e.,VOUT<0.8V) Measured in volts per microsecond(V/s). (Note 8) Maximum electrostatic discharge voltage for any pins:180V(C=200pF,R=0)
4
2007-10-01
TLP554
IF=7.5mA
5
2007-10-01
TLP554
6
2007-10-01
TLP554
7
2007-10-01
TLP554
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
8
2007-10-01

▲Up To Search▲

Price & Availability of TLP55407

	To Download TLP55407 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .